Documents

Only non confidential documents. Please contact the scientific coordinator of the project for more information: sonia.bendhia 'at' insa-toulouse.

• Kick-off meeting presentation (September 20th 2009)
• Electromagnetic Reliability for Deep Submicron Technologies
• Evaluation of the impact of IC aging on EMC compliance (in French)
• Still EMC Compliant? (Presentation at LOTUS workshop - ESREF 2009)

Publications

Please contact the scientific coordinator of the project for more information: sonia.bendhia 'at' insa-toulouse.

• B. Li, A. C. Ndoye, A. Boyer, S. Ben Dhia, "Characterization of the electromagnetic robustness of a nanoscale CMOS integrated circuit", EMC Compo 2009, Toulouse, November 2009
• A. Boyer, A. C. Ndoye, S. Ben Dhia, L. Guillot, B. Vrignon, "Characterization of the Evolution of Integrated Circuit Emission after Accelerated Aging", IEEE Transactions on EMC, Vol. 51, N°4, November 2009, pp 892 – 900.
• S. Ben Dhia, A. Boyer, B. Li, A. C. Noye, “Characterization of the Electromagnetic behavior drifts of a nanoscale IC after Accelerated Life Tests”, Electronic Letters, 18th February 2010, Vol. 46, no. 4
• B. Li, A. Boyer, S. Ben Dhia, C. Lemoine, "Ageing effect on immunity of a mixed signal IC", 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility, April 12 - 16, 2010, Beijing, China